Optional Post-Conference Workshops

Tuesday, December 12, 2017

Certification in Hotel Industry Analytics (CHIA), offered by the STR SHARE Center

8:30 AM – 4:00 PM (Room opens at 8:00 AM), Rosen College Room 102-R

The Certification in Hotel Industry Analytics (CHIA) is the leading certification for graduate students and faculty in Hospitality and Tourism programs. This recognition provides evidence of a thorough knowledge of the foundational metrics, definitions, formulas and methodologies that are used by the hotel industry. Recipients have proven that they can “do the math” and interpret the results. They have demonstrated an ability to analyze various types of hotel industry data and to make strategic inferences based upon that analysis. Certification also confirms a comprehensive understanding of benchmarking and performance reports that are used by industry professionals. Recipients have a grasp of the current landscape of the hotel industry, including relevant current events.

Seminar Core Content Areas:

  1. Hotel Industry Analytical Foundations
  2. Hotel Math Fundamentals: The metrics used by the Hotel Industry
  3. Property Level Benchmarking (STAR Reports)
  4. Hotel Industry Performance Reports (Trends, P&L, Pipeline, and Destination Reports)

There is no advance knowledge required for this seminar. You can find more information about the CHIA certification at https://www.strglobal.com/products/chia

The session is available to full-time faculty at no cost; however, there is a $75 certification fee for students and $595 (which includes the $300 certification fee and $295 workshop) for industry professionals.  The fee is discounted to $545 for AHLA members.

To register, please email sharecenter@str.com



PLS-SEM: A Hands-On Training Using SmartPLS, offered by Dr. Faizen Ali

10:00 AM – 3:00 PM, Rosen College Computer Lab

This workshop will introduce the use of PLS-SEM (Partial Least Squares – Structural Equation Modeling) and will teach postgraduate students/new researchers how to conduct SEM using SmartPLS software and how to present the results professionally. The workshop offers a practical hands-on approach, with real research datasets and research questions that can be answered using these datasets. By the end of this workshop, participants will be able to:

  • Understand the difference between two main types of SEM: Covariance-based SEM and PLS-SEM
  • Understand the conditions where PLS-SEM can be used
  • Apply PLS-SEM to analyze research data

Workshop Topics/Outline:

  1. Basics of SEM
  2. Formative vs Reflective Measurement
  3. Second Order Factors
  4. Measurement Model Evaluation 
    1. a. Convergent validity: 3 approaches (Factor loadings, AVEs, Reliability)
    2. b. Discriminant validity
  5. Structural Model analysis & evaluation.
  6. Moderating and Mediating Effect Analysis
  7. An Overview of Advanced PLS-SEM Analysis

For all participants, some knowledge of statistics, linear regression, and the characteristics of normal random variables and probability distributions will be helpful. A laptop is not required, but participants are welcome to bring one if desired. Dr. Ali will provide instruction on how to download a free version of SmartPLS.

This seminar is currently full. To be placed on the wait list, please email Marissa.Orlowski@ucf.edu

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Organized by
 
  • Elsevier
  • Rosen College
Exhibitors
 
  • Share Center
  • MMGY-global
Supporting Publications